Facilities
Transmission electron microscope
 
Model: JEOL  JEM-3000F
Emission gun: Field-emission  (Schottky)
Accelerating  voltage: 200 & 300 kV
Resolution: 0.17  nm@300 kV (point)
Attachment:  Energy dispersive x-ray spectrometer
X-ray diffractometer
 
Model: PANalytical X’Pert PRO MPD
Source: Co tube
Output: 45 kV – 40 mA
Ion milling
 
Model: GATAN PIPS 691
Acceleration energy: 1 – 6 kV
High frequency induction furnace
 
Model: MIWA SEISAKUSHO
Temperature: 800 – 2000 ℃
Atmosphere: Vacuum or inert gas
Mechanical polishing system
 
Model: South Bay Technology
Mechanical polisher & Tripod polisher
Imaging plate reader
 
Model: DITABIS MICRON

