ナノ構造解析学研究室

Facilities

Transmission electron microscope

Model: JEOL JEM-3000F
Emission gun: Field-emission (Schottky)
Accelerating voltage: 200 & 300 kV
Resolution: 0.17 nm@300 kV (point)
Attachment: Energy dispersive x-ray spectrometer

X-ray diffractometer

Model: PANalytical X’Pert PRO MPD
Source: Co tube
Output: 45 kV – 40 mA

Ion milling

Model: GATAN PIPS 691
Acceleration energy: 1 – 6 kV

High frequency induction furnace

Model: MIWA SEISAKUSHO
Temperature: 800 – 2000 ℃
Atmosphere: Vacuum or inert gas

Mechanical polishing system

Model: South Bay Technology
Mechanical polisher & Tripod polisher

Imaging plate reader

Model: DITABIS MICRON

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