Facilities
Transmission electron microscopes (TEM)
Crystal structures and nano- structures from atomic scale to nanoscale can be directly investigated, by utilizing the transmitted and diffracted electrons that are accelerated and pass through the material.
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JEM-3000F (JEOL: Ishimaru Lab.)
Acceleration voltage: 300kV
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Field emission electron gun / Energy dispersive X-ray spectrometer
Capable of observations during heating and cooling.
With the highest resolution among universal TEMs. |
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JEM-F200 (JEOL: Kyutech CIA)
Acceleration voltage: 200kV
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Field emission electron gun / Energy dispersive X-ray spectrometer
The latest universal TEM introduced in March 2020.
Capable of 2D chemical mapping of 4 nm or less. |
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X-ray diffractometers
Crystal structures can be investigated by detecting X-rays diffracted by the materials.
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Desktop X-ray diffractometer
Rigaku MiniFlex600
A multipurpose powder X-ray diffractometer that can be used for Identification of crystal structures and structural refinement in ceramics and single crystals.
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Synchrotron powder X-ray multiple detector system (BL-4B2 at KEK)
A ultrahigh-precision powder X-ray diffractometer that uses monochromatized synchrotron radiation and multiple detectors. High-quality structural refinements can be performed.
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Automated high-resolution multipurpose X-ray diffractometer
(Kyutech CIA)
Rigaku SmartLab
A multipurpose powder X-ray diffractometer that equips high-flux 9 kW rotating anode X-ray source. Identification of crystal structures and structural refinement can be carried out at room temperature and on heating.
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TEM sample preparation equipments
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Ion milling
Gatan PIPS Model 691
A device that uses argon ion beams to thin a sample to about 50 nm for TEM observations.
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Carbon coating equipment
JEOL JEC-530
A device for depositing an ultra-thin carbon film on the sample surface to prevent charging of the insulator sample.
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Rotating polisher / tripod polisher
A device for mechanically polishing samples to about 10 μm before ion milling.
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Optical microscope (2 upright type / 1 inverted type/ 1 digital type)
It is used to check the sample surface conditions and milling conditions.
Images can also be take with a CCD cameras.
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Ceramic / single crystal sample preparation equipments
High temperatures and various environments are needed to chemically react the starting materials for preparations of ceramics and single crystals. Therefore, we use various electric furnaces that can reach ultra-high temperatures and control the environments.
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Floating zone melting furnace
Crystal system Four-elliptical mirror type FZ-T-4000-H-CU-1
A electric furnace to grow single crystals by floating zone melting method.
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Ultra-high temperature vertical tube furnace
Crystal System VF-1800 / EF-6000
Maximum temperature: 1800 °C
Normal temperature: 1700 °C
Sample rotation & elevating type
Ultra-high temperature vertical tube furnace
FUTEK FURNACE T-4B08 (1 other)
Maximum temperature: 1850 °C
Normal temperature: 1800 °C
Ultra-high temperature tube furnace
NIKKATO T-4B10H
Maximum temperature: 1850 °C
Normal temperature: 1800 °C
Environmental control type: With gas flow controller
High temperature tube furnace
Yamada Denki TS-520
Maximum temperature: 1500 °C
Normal temperature: 1400 °C
Environmental precision control type: With gas partial pressure precision control device
High temperature tube furnace:
NIKKATO KS-1800
Maximum temperature: 1800 °C
Normal temperature: 1600 °C
Environmental control type: With gas flow controller
Tube furnace
ISUZU EKR-11K (3 others)
Maximum temperature: 1100-1200 °C
Normal temperature: 1000-1200 °C
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High temperature muffle furnace
MOTOYAMA SuperBurn
Maximum temperature: 1600 °C
Normal temperature: 1500 °C
Muffle furnace
DENKEN KDF SF70 (3 others)
Maximum temperature: 1100 to 1300 °C
Normal temperature: 1000-1250 °C
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Ultra-high temperature vertical tube furnace
Ultra-high temperature tube furnace
High temperature tube furnace
Ultra-high temperature vertical tube furnace
High temperature tube furnace
High temperature muffle furnace
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Physical property measurement equipments
Physical properties such as piezo characteristics, electric field-polarization hysteresis characteristics, temperature dependences of electrical resistivities and dielectric constants, etc are measured in ceramics and single crystals.
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Ferroelectric characterization system
Toyo Technica FCE10-S / 10KS
Electric field-polarization hysteresis characteristics and piezo characteristics can be measured.
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Ferroelectric characterization system |
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Electrical resistivity / dielectric constant measurements
Digit Multimeter KEITHLEY 2110
Resistance Meter HIOKI RM3545
LCR Meter HIOKI IM3533
Temperature dependences of electrical resistivities and dielectric constants can be measured.
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